That's actually not correct. The issue for data retention and temperature is related to how long the data is retained in a non-powered state - not data retention whilst a device is running. An interesting fact is that data written at high temperatures (whilst a device has been up and running for some time and temperatures are high) has a longer retention rate in a non-powered state than data written at low temperatures (such as when a device has been powered only briefly).
The fact that operating temperatures are higher is not the concern or the purpose of these tests. The reporting of retention rates and at what temperatures or also industry norms and completely what potential partners will want to see.
Yes - it will be interesting to see what results are achieved at the 40 degrees level but that is not to evaluate performance in a powered and operating state.
Ann: Weebit Nano demonstrates commercially viable data retention, page-53
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